Rietveld method

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<Font color="blue"> Méthode de Rietveld </Font> (''Fr'').  
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<font color="blue">Méthode de Rietveld</font> (''Fr''). <font color="red">Rietveld-Methode</font> (''Ge''). <font color="black">Metodo di Rietveld</font> (''It''). <font color="purple">リートベルト法</font> (''Ja''). <font color="green">Método de Rietveld</font> (''Sp'').
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== Definition ==
== Definition ==
Method of analysing powder diffraction data in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile using a least-squares approach. There is no intermediate step of extracting structure factors, and so patterns containing many overlapping Bragg peaks can be analysed.
Method of analysing powder diffraction data in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile using a least-squares approach. There is no intermediate step of extracting structure factors, and so patterns containing many overlapping Bragg peaks can be analysed.
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== See also ==
== See also ==
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The Rietveld method.
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*The Rietveld method. A. Albinati and B. T. M. Willis. ''International Tables for Crystallography'' (2006). ''Vol. C'', [http://dx.doi.org/10.1107/97809553602060000614 ch. 8.6, pp. 710-712]
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A. Albinati and B. T. M. Willis. ''International Tables for Crystallography'' (2006). Vol. C, ch. 8.6, pp. 710-712  [http://dx.doi.org/10.1107/97809553602060000614 doi:10.1107/97809553602060000614]
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*''The Rietveld Method'', edited by R.A. Young. (1993). Oxford: IUCr/Oxford University Press.
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The Rietveld Method, edited by R.A. Young. (1993), Oxford: IUCr/Oxford University Press.
 
[[Category:Structure determination]]
[[Category:Structure determination]]

Latest revision as of 17:03, 17 November 2017

Méthode de Rietveld (Fr). Rietveld-Methode (Ge). Metodo di Rietveld (It). リートベルト法 (Ja). Método de Rietveld (Sp).


Definition

Method of analysing powder diffraction data in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile using a least-squares approach. There is no intermediate step of extracting structure factors, and so patterns containing many overlapping Bragg peaks can be analysed.


History

The method was applied originally by H. Rietveld [(1967). Acta Cryst. 22, 151–152. Line profiles of neutron powder diffraction peaks for structure refinement; (1969). J. Appl. Cryst. 2, 65–71. A profile refinement method for nuclear and magnetic structures] to the refinement of neutron intensities recorded at a fixed wavelength. Subsequently, it has been used successfully for analysing powder data with neutrons or X-rays as the primary radiation and with scattered intensities measured at a fixed wavelength (and variable scattering angle) or at a fixed scattering angle (and variable wavelength).

See also

  • The Rietveld method. A. Albinati and B. T. M. Willis. International Tables for Crystallography (2006). Vol. C, ch. 8.6, pp. 710-712
  • The Rietveld Method, edited by R.A. Young. (1993). Oxford: IUCr/Oxford University Press.